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1 Ergebnisse
1
Effective Switching Probability Calculation to Locate Hotsp..:
, In:
2022 IEEE International Test Conference in Asia (ITC-Asia)
,
Utsunomiya, Taiki
;
Hoshino, Ryu
;
Miyase, Kohei
... - p. 43-48 , 2022
Link:
https://doi.org/10.1109/ITCAsia55616.2022.00018
RT T1 <cTitle>2022 IEEE International Test Conference in Asia (ITC-Asia)</cTitle>: T1 <Title>Effective Switching Probability Calculation to Locate Hotspots in Logic Circuits</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9946361&Exemplar=1&LAN=DE A1 Utsunomiya, Taiki A1 Hoshino, Ryu A1 Miyase, Kohei A1 Lu, Shyue-Kung A1 Wen, Xiaoqing A1 Kajihara, Seiji YR 2022 SN 2768-069X K1 Power demand K1 Logic circuits K1 Asia K1 Probability K1 Large scale integration K1 Delays K1 Central Processing Unit K1 at-speed testing K1 power consumption K1 IR-drop K1 transition delay test K1 test malfunction K1 probability of switching activity SP 43 OP 48 LK http://dx.doi.org/https://doi.org/10.1109/ITCAsia55616.2022.00018 DO https://doi.org/10.1109/ITCAsia55616.2022.00018 SF ELIB - SuUB Bremen
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