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Trap Behavior of Metamorphic HEMTs with Pulsed IV and $1/f$..:
, In:
ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC)
,
Shin, Ki-Yong
;
Shin, Ju-Won
;
Chakraborty, Surajit
... - p. 324-327 , 2022
Link:
https://doi.org/10.1109/ESSDERC55479.2022.9947118
RT T1
ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC)
: T1
Trap Behavior of Metamorphic HEMTs with Pulsed IV and $1/f$ Noise Measurement
UL https://suche.suub.uni-bremen.de/peid=ieee-9947118&Exemplar=1&LAN=DE A1 Shin, Ki-Yong A1 Shin, Ju-Won A1 Chakraborty, Surajit A1 Amir, Walid A1 Shin, Chan-Soo A1 Kim, Tae-Woo YR 2022 K1 Degradation K1 Buffer layers K1 Pulse measurements K1 Current measurement K1 mHEMTs K1 Gallium arsenide K1 1/f noise K1 Metamorphic Buffer K1 MHEMT K1 Lattice mismatch K1 Trap K1 Pulsed IV K1 degradation K1 Low-frequency noise measurement K1 Bulk trap density SP 324 OP 327 LK http://dx.doi.org/https://doi.org/10.1109/ESSDERC55479.2022.9947118 DO https://doi.org/10.1109/ESSDERC55479.2022.9947118 SF ELIB - SuUB Bremen
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