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1 Ergebnisse
1
Advanced Measurement and Simulation Approach for DDR5 On-ch..:
, In:
2022 IEEE 31st Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)
,
Choi, WonSuk
;
Kwak, SangKeun
;
Park, Jaeseok
... - p. 1-3 , 2022
Link:
https://doi.org/10.1109/EPEPS53828.2022.9947122
RT T1 <cTitle>2022 IEEE 31st Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)</cTitle>: T1 <Title>Advanced Measurement and Simulation Approach for DDR5 On-chip SI/PI with the Probing Package</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9947122&Exemplar=1&LAN=DE A1 Choi, WonSuk A1 Kwak, SangKeun A1 Park, Jaeseok A1 Do, Jiyoung A1 Yun, Byeongseon A1 Kwon, Yoo-Jeong A1 Kim, Dongyeop A1 Lee, Kyudong A1 Kim, Tae Young A1 Kim, Wonyoung A1 Kim, Kyoungsun A1 Park, Sung Joo A1 Cho, Jeonghyeon A1 Song, Hoyoung YR 2022 SN 2165-4115 K1 Measurement errors K1 Analytical models K1 Power measurement K1 Measurement uncertainty K1 Random access memory K1 Memory modules K1 System-on-chip K1 DDR5 K1 SI K1 PI K1 Interposer K1 Probing package K1 Measurement SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EPEPS53828.2022.9947122 DO https://doi.org/10.1109/EPEPS53828.2022.9947122 SF ELIB - SuUB Bremen
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