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1 Ergebnisse
1
III-V HBTs on 300 mm Si substrates using merged nano-ridges..:
, In:
ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC)
,
Vais, A.
;
Yadav, S.
;
Mols, Y.
... - p. 261-264 , 2022
Link:
https://doi.org/10.1109/ESSDERC55479.2022.9947124
RT T1
ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC)
: T1
III-V HBTs on 300 mm Si substrates using merged nano-ridges and its application in the study of impact of defects on DC and RF performance
UL https://suche.suub.uni-bremen.de/peid=ieee-9947124&Exemplar=1&LAN=DE A1 Vais, A. A1 Yadav, S. A1 Mols, Y. A1 Vermeersch, B. A1 Kodandarama, K. V. A1 Baryshnikova, M. A1 Mannaert, G. A1 Alcotte, R. A1 Boccardi, G. A1 Wambacq, P. A1 Parvais, B. A1 Langer, R. A1 Kunert, B. A1 Collaert, N. YR 2022 K1 Performance evaluation K1 Radio frequency K1 Solid modeling K1 Three-dimensional displays K1 Monte Carlo methods K1 Nanoscale devices K1 Silicon K1 III-V K1 HBT K1 III-V-on-Si K1 5G SP 261 OP 264 LK http://dx.doi.org/https://doi.org/10.1109/ESSDERC55479.2022.9947124 DO https://doi.org/10.1109/ESSDERC55479.2022.9947124 SF ELIB - SuUB Bremen
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