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1 Ergebnisse
1
InP DHBT test structure optimization towards 110 GHz charac..:
, In:
ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC)
,
Davy, Nil
;
Deng, Marina
;
Nodjiadjim, Virginie
... - p. 320-323 , 2022
Link:
https://doi.org/10.1109/ESSDERC55479.2022.9947170
RT T1 <cTitle>ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC)</cTitle>: T1 <Title>InP DHBT test structure optimization towards 110 GHz characterization</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9947170&Exemplar=1&LAN=DE A1 Davy, Nil A1 Deng, Marina A1 Nodjiadjim, Virginie A1 Mukherjee, Chhandak A1 Riet, Muriel A1 Mismer, Colin A1 Renaudier, Jeremic A1 Maneux, Cristell YR 2022 K1 Performance evaluation K1 Double heterojunction bipolar transistors K1 Particle measurements K1 Frequency measurement K1 High frequency K1 III-V semiconductor materials K1 Probes K1 Characterization K1 Millimeter-wave K1 Double heterojunction bipolar transistor (DHBT) K1 InP/InGaAs K1 Indium Phosphide (InP) SP 320 OP 323 LK http://dx.doi.org/https://doi.org/10.1109/ESSDERC55479.2022.9947170 DO https://doi.org/10.1109/ESSDERC55479.2022.9947170 SF ELIB - SuUB Bremen
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