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1 Ergebnisse
1
On the Effect of SiC Power MOSFET Gate Oxide Degradation in..:
, In:
2022 IEEE Energy Conversion Congress and Exposition (ECCE)
,
Naghibi, Javad
;
Mohsenzade, Sadegh
;
Iqbal, Saqib
.. - p. 1-6 , 2022
Link:
https://doi.org/10.1109/ECCE50734.2022.9947441
RT T1
2022 IEEE Energy Conversion Congress and Exposition (ECCE)
: T1
On the Effect of SiC Power MOSFET Gate Oxide Degradation in High Frequency Phase Leg-Based Applications
UL https://suche.suub.uni-bremen.de/peid=ieee-9947441&Exemplar=1&LAN=DE A1 Naghibi, Javad A1 Mohsenzade, Sadegh A1 Iqbal, Saqib A1 Mehran, Kamyar A1 Foster, Martin P. YR 2022 SN 2329-3748 K1 Degradation K1 Legged locomotion K1 MOSFET K1 Silicon carbide K1 Switches K1 Logic gates K1 Threshold voltage K1 Dead-time K1 Half bridge K1 Silicon Carbide (SiC) SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ECCE50734.2022.9947441 DO https://doi.org/10.1109/ECCE50734.2022.9947441 SF ELIB - SuUB Bremen
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