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1 Ergebnisse
1
Positive and Negative Bias Temperature Instability on Cross..:
, In:
2022 IEEE Energy Conversion Congress and Exposition (ECCE)
,
Yang, Juefei
;
Jahdi, Saeed
;
Stark, Bernard
... - p. 1-7 , 2022
Link:
https://doi.org/10.1109/ECCE50734.2022.9948074
RT T1
2022 IEEE Energy Conversion Congress and Exposition (ECCE)
: T1
Positive and Negative Bias Temperature Instability on Crosstalk-Stressed Symmetrical & Asymmetrical Double-Trench SiC MOSFETs
UL https://suche.suub.uni-bremen.de/peid=ieee-9948074&Exemplar=1&LAN=DE A1 Yang, Juefei A1 Jahdi, Saeed A1 Stark, Bernard A1 Shen, Chengjun A1 Alatise, Olayiwola A1 Ortiz-Gonzalez, Jose A1 Mellor, Phil YR 2022 SN 2329-3748 K1 Temperature measurement K1 Negative bias temperature instability K1 MOSFET K1 Voltage measurement K1 Silicon carbide K1 Thermal variables control K1 Current measurement K1 Silicon Carbide K1 BTI K1 Crosstalk K1 Double-Trench SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/ECCE50734.2022.9948074 DO https://doi.org/10.1109/ECCE50734.2022.9948074 SF ELIB - SuUB Bremen
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