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1
Predicting Transistor-level Hotspots with Thermal Resistanc..:
, In:
2022 28th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
,
Elebert, Patrick
;
Xue, Xiaojie
;
Heffernan, Colm
- p. 1-4 , 2022
Link:
https://doi.org/10.1109/THERMINIC57263.2022.9950661
RT T1
2022 28th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
: T1
Predicting Transistor-level Hotspots with Thermal Resistance Metrics and Compact Thermal Models
UL https://suche.suub.uni-bremen.de/peid=ieee-9950661&Exemplar=1&LAN=DE A1 Elebert, Patrick A1 Xue, Xiaojie A1 Heffernan, Colm YR 2022 SN 2474-1523 K1 Resistance K1 Temperature K1 Thermal resistance K1 Predictive models K1 Transistors K1 Integrated circuit modeling K1 Junctions K1 thermal simulation K1 temperature driven wearout K1 compact thermal model K1 JEDEC standards SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/THERMINIC57263.2022.9950661 DO https://doi.org/10.1109/THERMINIC57263.2022.9950661 SF ELIB - SuUB Bremen
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