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1 Ergebnisse
1
Cryogenic Steep Slope Field-Effect Transistors:
, In:
2022 IEEE Silicon Nanoelectronics Workshop (SNW)
,
Knoch, J.
;
Richstein, B.
;
Han, Y.
... - p. 1-2 , 2022
Link:
https://doi.org/10.1109/SNW56633.2022.9953898
RT T1
2022 IEEE Silicon Nanoelectronics Workshop (SNW)
: T1
Cryogenic Steep Slope Field-Effect Transistors
UL https://suche.suub.uni-bremen.de/peid=ieee-9953898&Exemplar=1&LAN=DE A1 Knoch, J. A1 Richstein, B. A1 Han, Y. A1 Konig, D. A1 Frentzen, M. A1 Hellmich, L. A1 Klos, J. A1 Scholz, S. A1 Zhao, Q.T. YR 2022 SN 2161-4644 K1 MOSFET K1 Voltage measurement K1 Current measurement K1 Conferences K1 Cryogenics K1 Silicon K1 Transistors SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/SNW56633.2022.9953898 DO https://doi.org/10.1109/SNW56633.2022.9953898 SF ELIB - SuUB Bremen
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