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1
Methodical Approach for SEL Tolerance Confirmation of CMOS ..:
, In:
2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
,
Novikova, Marina M.
;
Novikov, Alexander A.
;
Pechenkin, Alexander A.
... - p. 1-4 , 2021
Link:
https://doi.org/10.1109/RADECS53308.2021.9954467
RT T1 <cTitle>2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS)</cTitle>: T1 <Title>Methodical Approach for SEL Tolerance Confirmation of CMOS ICs at Low Temperatures</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9954467&Exemplar=1&LAN=DE A1 Novikova, Marina M. A1 Novikov, Alexander A. A1 Pechenkin, Alexander A. A1 Lukashin, Vladislav P. A1 Oblova, Evgeniya N A1 Gritsaenko, Albina R. A1 Protasov, Dmirty E. A1 Tararaksin, Alexander S. YR 2021 SN 1609-0438 K1 Temperature sensors K1 Integrated circuits K1 Sensitivity K1 Lasers K1 Europe K1 Estimation K1 Ions K1 SEL K1 laser technique K1 heavy ions K1 low temperature SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/RADECS53308.2021.9954467 DO https://doi.org/10.1109/RADECS53308.2021.9954467 SF ELIB - SuUB Bremen
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