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Impact of the Data Retention Threshold Voltage on the Cell-..:
, In:
2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
,
Rezaei, Mohammadreza
;
Panduro, Arturo Arinero
;
Franco, Francisco J.
... - p. 1-4 , 2021
Link:
https://doi.org/10.1109/RADECS53308.2021.9954475
RT T1
2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
: T1
Impact of the Data Retention Threshold Voltage on the Cell-to-Cell SEU Sensitivity of COTS SRAMs
UL https://suche.suub.uni-bremen.de/peid=ieee-9954475&Exemplar=1&LAN=DE A1 Rezaei, Mohammadreza A1 Panduro, Arturo Arinero A1 Franco, Francisco J. A1 Fabero, Juan Carlos A1 Mecha, Hortensia A1 Letiche, Manon A1 Puchner, Helmut A1 Clemente, Juan Antonio YR 2021 SN 1609-0438 K1 Radiation effects K1 Sensitivity K1 Correlation K1 Random access memory K1 Europe K1 Neutrons K1 Threshold voltage K1 COTS K1 SRAM K1 Thermal neutron tests K1 radiation hardness K1 reliability K1 soft error SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/RADECS53308.2021.9954475 DO https://doi.org/10.1109/RADECS53308.2021.9954475 SF ELIB - SuUB Bremen
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