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1 Ergebnisse
1
A Neural Network Approach for Single-Event Latchup Predicti..:
, In:
2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
,
Truyen, D.
;
Leduc, E.
;
Montagner, L.
.. - p. 1-5 , 2021
Link:
https://doi.org/10.1109/RADECS53308.2021.9954493
RT T1
2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
: T1
A Neural Network Approach for Single-Event Latchup Prediction Based on TCAD Simulations in CMOS Technology
UL https://suche.suub.uni-bremen.de/peid=ieee-9954493&Exemplar=1&LAN=DE A1 Truyen, D. A1 Leduc, E. A1 Montagner, L. A1 Briet, M. A1 Collange, A. YR 2021 SN 1609-0438 K1 Semiconductor device modeling K1 Sensitivity K1 Input variables K1 Layout K1 Europe K1 Predictive models K1 CMOS technology K1 Neural network K1 predictive model K1 single event latchup K1 SEL SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/RADECS53308.2021.9954493 DO https://doi.org/10.1109/RADECS53308.2021.9954493 SF ELIB - SuUB Bremen
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