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1 Ergebnisse
1
Micro-Latchup Location and Temperature Characterization in ..:
, In:
2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
,
Pieper, N. J.
;
Xiong, Y.
;
Feeley, A.
... - p. 1-7 , 2021
Link:
https://doi.org/10.1109/RADECS53308.2021.9954525
RT T1 <cTitle>2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS)</cTitle>: T1 <Title>Micro-Latchup Location and Temperature Characterization in a 7-nm Bulk FinFET Technology</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9954525&Exemplar=1&LAN=DE A1 Pieper, N. J. A1 Xiong, Y. A1 Feeley, A. A1 Walker, D. G. A1 Fung, R. A1 Wen, S.-J. A1 Ball, D. R. A1 Bhuva, B. L. YR 2021 SN 1609-0438 K1 Temperature measurement K1 Integrated circuits K1 Rails K1 Temperature K1 Voltage measurement K1 Power supplies K1 Image edge detection K1 Complementary metal-oxide-semiconductor (CMOS) K1 bulk FinFET K1 alpha particles K1 temperature K1 latchup K1 single-event latchup (SEL) K1 single event effects K1 cross section K1 technology computer aided design (TCAD) K1 radiation effects K1 holding voltage SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/RADECS53308.2021.9954525 DO https://doi.org/10.1109/RADECS53308.2021.9954525 SF ELIB - SuUB Bremen
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