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1 Ergebnisse
1
7nm FinFET technology heavy ion SEL evaluation using Xilinx..:
, In:
2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
,
Dufour, Arnaud
;
Carron, Jerome
;
Pierron, Francois
... - p. 1-6 , 2021
Link:
https://doi.org/10.1109/RADECS53308.2021.9954564
RT T1 <cTitle>2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS)</cTitle>: T1 <Title>7nm FinFET technology heavy ion SEL evaluation using Xilinx Versal as case study</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9954564&Exemplar=1&LAN=DE A1 Dufour, Arnaud A1 Carron, Jerome A1 Pierron, Francois A1 Fongral, Matthieu A1 Dangla, David A1 Bascoul, Guillaume A1 Bezerra, Francoise A1 Mekki, Julien A1 Malou, Florence A1 Maillard, Pierre YR 2021 SN 1609-0438 K1 Performance evaluation K1 Temperature sensors K1 Single event latchup K1 Semiconductor lasers K1 Voltage K1 Ions K1 FinFETs K1 SoC K1 7nm FinFET K1 Versal K1 Xilinx K1 SEL K1 Heavy ion K1 Laser SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/RADECS53308.2021.9954564 DO https://doi.org/10.1109/RADECS53308.2021.9954564 SF ELIB - SuUB Bremen
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