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1 Ergebnisse
1
Short-Circuit Ruggedness and Partial Discharge Evaluation o..:
, In:
2022 IEEE 9th Workshop on Wide Bandgap Power Devices & Applications (WiPDA)
,
Wang, Ke
;
Cong, Yizhou
;
Fu, Pengyu
... - p. 154-158 , 2022
Link:
https://doi.org/10.1109/WiPDA56483.2022.9955280
RT T1 <cTitle>2022 IEEE 9th Workshop on Wide Bandgap Power Devices & Applications (WiPDA)</cTitle>: T1 <Title>Short-Circuit Ruggedness and Partial Discharge Evaluation of a 3.3 kV SiC MOSFET Power Module</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9955280&Exemplar=1&LAN=DE A1 Wang, Ke A1 Cong, Yizhou A1 Fu, Pengyu A1 Li, Xiao A1 Cheng, Qianyi A1 Hu, Boxue A1 Wang, Jin A1 Kumar, Ashish A1 Olejniczak, Kraig A1 Pelletier, Daniel A1 Cole, Zach A1 Deshpande, Amol A1 Goyal, Amit YR 2022 SN 2687-8577 K1 Partial discharges K1 MOSFET K1 Silicon carbide K1 Multichip modules K1 Threshold voltage K1 Sea level K1 Leakage currents K1 3.3 kV power module K1 static parameters K1 short circuit evaluation K1 partial discharge K1 low air pressure SP 154 OP 158 LK http://dx.doi.org/https://doi.org/10.1109/WiPDA56483.2022.9955280 DO https://doi.org/10.1109/WiPDA56483.2022.9955280 SF ELIB - SuUB Bremen
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