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1 Ergebnisse
1
Parameter Extraction of Thin-Film Scandium-Doped Aluminum N..:
, In:
2022 IEEE International Ultrasonics Symposium (IUS)
,
Ghosh, Sagnik
;
Ramegowda, Prakasha
;
Ng, Eldwin
... - p. 1-4 , 2022
Link:
https://doi.org/10.1109/IUS54386.2022.9958677
RT T1
2022 IEEE International Ultrasonics Symposium (IUS)
: T1
Parameter Extraction of Thin-Film Scandium-Doped Aluminum Nitride in Piezoelectric Over Silicon-On-Nothing Platform
UL https://suche.suub.uni-bremen.de/peid=ieee-9958677&Exemplar=1&LAN=DE A1 Ghosh, Sagnik A1 Ramegowda, Prakasha A1 Ng, Eldwin A1 Ali, Zishan A1 Goh, Duan Jian A1 Sharma, Jaibir A1 Wong, Han Xuan A1 Lee, Joshua YR 2022 SN 1948-5727 K1 Young's modulus K1 Sensitivity K1 Capacitors K1 Resonant frequency K1 Scandium K1 Silicon K1 Resonators K1 Compliance matrix K1 relative permittivity K1 sensitivity K1 iterative gradient descent method K1 piezoelectric over silicon-on-nothing process SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IUS54386.2022.9958677 DO https://doi.org/10.1109/IUS54386.2022.9958677 SF ELIB - SuUB Bremen
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