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1 Ergebnisse
1
Dynamic RDS(on) Testing for GaN Devices Considering Third Q..:
, In:
2022 IEEE International Power Electronics and Application Conference and Exposition (PEAC)
,
Xie, Zonglun
;
Dong, Zezheng
;
Wu, Xinke
.. - p. 39-42 , 2022
Link:
https://doi.org/10.1109/PEAC56338.2022.9959234
RT T1
2022 IEEE International Power Electronics and Application Conference and Exposition (PEAC)
: T1
Dynamic RDS(on) Testing for GaN Devices Considering Third Quadrant and Different Operating Conditions
UL https://suche.suub.uni-bremen.de/peid=ieee-9959234&Exemplar=1&LAN=DE A1 Xie, Zonglun A1 Dong, Zezheng A1 Wu, Xinke A1 Yang, Shu A1 Sheng, Kuang YR 2022 K1 Resistance K1 Power electronics K1 Behavioral sciences K1 Electrical resistance measurement K1 Testing K1 GaN HEMTs K1 3rd quadrant K1 multi-pulse testing mode K1 dynamic resistance SP 39 OP 42 LK http://dx.doi.org/https://doi.org/10.1109/PEAC56338.2022.9959234 DO https://doi.org/10.1109/PEAC56338.2022.9959234 SF ELIB - SuUB Bremen
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