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Dynamic RDS(on) Testing for GaN Devices Considering Third Q..:

, In: 2022 IEEE International Power Electronics and Application Conference and Exposition (PEAC),
Xie, Zonglun ; Dong, Zezheng ; Wu, Xinke.. - p. 39-42 , 2022
Link: https://doi.org/10.1109/PEAC56338.2022.9959234