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1 Ergebnisse
1
Test and Evolution Process Analysis of Vacuum Interrupter F..:
, In:
2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE)
,
Bao, Lianwei
;
Zhao, Linjie
;
Lei, Yuanyuan
... - p. 1-4 , 2022
Link:
https://doi.org/10.1109/ICHVE53725.2022.9961335
RT T1
2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE)
: T1
Test and Evolution Process Analysis of Vacuum Interrupter Failure of Vacuum Type On-load Tap Changer
UL https://suche.suub.uni-bremen.de/peid=ieee-9961335&Exemplar=1&LAN=DE A1 Bao, Lianwei A1 Zhao, Linjie A1 Lei, Yuanyuan A1 Yang, Jiahui A1 Zhang, Xi A1 Huang, Kejie A1 Wang, Shuaibing YR 2022 SN 2474-3852 K1 Interrupters K1 Switches K1 Voltage K1 Circuit faults K1 Transient analysis K1 On load tap changers K1 Integrated circuit reliability SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICHVE53725.2022.9961335 DO https://doi.org/10.1109/ICHVE53725.2022.9961335 SF ELIB - SuUB Bremen
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