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1 Ergebnisse
1
Influence of Sheath-core Interface Defects on the Decay-fra..:
, In:
2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE)
,
Fan, Yu
;
Fang, Yonghao
;
Du, Yijun
... - p. 1-6 , 2022
Link:
https://doi.org/10.1109/ICHVE53725.2022.9961555
RT T1 <cTitle>2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE)</cTitle>: T1 <Title>Influence of Sheath-core Interface Defects on the Decay-fracture of Composite Insulators</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9961555&Exemplar=1&LAN=DE A1 Fan, Yu A1 Fang, Yonghao A1 Du, Yijun A1 Zhou, Songsong A1 Yu, Xinzhe A1 Xu, Yueneng A1 Zhou, Jun A1 Gu, Chen A1 Deng, Yu YR 2022 SN 2474-3852 K1 Degradation K1 Temperature measurement K1 Partial discharges K1 Liquids K1 Epoxy resins K1 High-voltage techniques K1 Rate distortion theory SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ICHVE53725.2022.9961555 DO https://doi.org/10.1109/ICHVE53725.2022.9961555 SF ELIB - SuUB Bremen
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