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1 Ergebnisse
1
Neutron Irradiation Testing and Analysis of a Fault-Toleran..:
, In:
2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
,
Santos, Douglas A.
;
Mattos, Andre M. P.
;
Luza, Lucas M.
... - p. 1-6 , 2022
Link:
https://doi.org/10.1109/DFT56152.2022.9962335
RT T1
2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
: T1
Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip
UL https://suche.suub.uni-bremen.de/peid=ieee-9962335&Exemplar=1&LAN=DE A1 Santos, Douglas A. A1 Mattos, Andre M. P. A1 Luza, Lucas M. A1 Cazzaniga, Carlo A1 Kastriotou, Maria A1 Melo, Douglas R. A1 Dilillo, Luigi YR 2022 SN 2765-933X K1 Fault tolerance K1 Radiation effects K1 Error analysis K1 Atmospheric modeling K1 Fault tolerant systems K1 Neutrons K1 Benchmark testing K1 RISC-V K1 System-on-Chip K1 Fault Tolerance K1 Radiation Effects K1 Dependable Systems SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/DFT56152.2022.9962335 DO https://doi.org/10.1109/DFT56152.2022.9962335 SF ELIB - SuUB Bremen
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