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Selective Hardening of CNNs based on Layer Vulnerability Es..:

, In: 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Bolchini, Cristiana ; Cassano, Luca ; Miele, Antonio. - p. 1-6 , 2022
Link: https://doi.org/10.1109/DFT56152.2022.9962339