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Operational Age Estimation of ICs using Gaussian Process Re..:

, In: 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Narwariya, Anmol Singh ; Das, Pabitra ; Khursheed, Saqib. - p. 1-5 , 2022
Link: https://doi.org/10.1109/DFT56152.2022.9962355