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Cross-Correlation Approach to Detecting Issue Test Sites in..:

, In: 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Farayola, Praise O. ; Bruce, Isaac ; Chaganti, Shravan K.... - p. 1-6 , 2022
Link: https://doi.org/10.1109/DFT56152.2022.9962367