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1 Ergebnisse
1
Bias Temperature Instability Analysis of Nanosheet Based SR..:
, In:
2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)
,
Wang, Yun-Qi
;
Li, Gao-Peng
;
Li, Cong
... - p. 1-3 , 2022
Link:
https://doi.org/10.1109/ICSICT55466.2022.9963184
RT T1
2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)
: T1
Bias Temperature Instability Analysis of Nanosheet Based SRAM
UL https://suche.suub.uni-bremen.de/peid=ieee-9963184&Exemplar=1&LAN=DE A1 Wang, Yun-Qi A1 Li, Gao-Peng A1 Li, Cong A1 Kuang, Feng-Yu A1 Li, Ou-Wen A1 You, Hai-Long YR 2022 K1 Integrated circuit technology K1 Degradation K1 Aging K1 SRAM cells K1 Inverters K1 Nanostructures K1 Circuit synthesis SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/ICSICT55466.2022.9963184 DO https://doi.org/10.1109/ICSICT55466.2022.9963184 SF ELIB - SuUB Bremen
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