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Bias Temperature Instability Analysis of Nanosheet Based SR..:

, In: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT),
Wang, Yun-Qi ; Li, Gao-Peng ; Li, Cong... - p. 1-3 , 2022
Link: https://doi.org/10.1109/ICSICT55466.2022.9963184