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1 Ergebnisse
1
Criteria for selecting statistical distribution for the Amp..:
, In:
2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)
,
Tok, Kean Hong
;
Mehedi, Mehzabeen
;
Zhang, Jian Fu
... - p. 1-4 , 2022
Link:
https://doi.org/10.1109/ICSICT55466.2022.9963221
RT T1 <cTitle>2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)</cTitle>: T1 <Title>Criteria for selecting statistical distribution for the Amplitude of Random Telegraph Noise</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9963221&Exemplar=1&LAN=DE A1 Tok, Kean Hong A1 Mehedi, Mehzabeen A1 Zhang, Jian Fu A1 Ye, Zengliang A1 Ji, Zhigang A1 Zhang, Weidong A1 Marsland, John YR 2022 K1 Integrated circuit technology K1 Monte Carlo methods K1 Fitting K1 Stochastic processes K1 Circuit synthesis K1 Integrated circuit modeling K1 Distribution functions SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICSICT55466.2022.9963221 DO https://doi.org/10.1109/ICSICT55466.2022.9963221 SF ELIB - SuUB Bremen
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