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1 Ergebnisse
1
Characterization of Reliabilities of 22 nm UTBB FDSOI Ring ..:
, In:
2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)
,
Cai, Chang
;
Zhao, Kai
;
Yu, Jian
... - p. 1-3 , 2022
Link:
https://doi.org/10.1109/ICSICT55466.2022.9963255
RT T1 <cTitle>2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)</cTitle>: T1 <Title>Characterization of Reliabilities of 22 nm UTBB FDSOI Ring Oscillators</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9963255&Exemplar=1&LAN=DE A1 Cai, Chang A1 Zhao, Kai A1 Yu, Jian A1 Chen, Gengsheng A1 Shen, Mingjie A1 Ning, Bingxu A1 Yu, Jun YR 2022 K1 Temperature measurement K1 Ring oscillators K1 Integrated circuit technology K1 Degradation K1 Current measurement K1 Silicon-on-insulator K1 Inverters SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/ICSICT55466.2022.9963255 DO https://doi.org/10.1109/ICSICT55466.2022.9963255 SF ELIB - SuUB Bremen
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