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1 Ergebnisse
1
A Rigorous Analysis of Specific ON-resistance for 4H-SiC Su..:
, In:
2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)
,
Xiong, Juncheng
;
Huang, Haimeng
;
Zhen, Wenxi
... - p. 1-3 , 2022
Link:
https://doi.org/10.1109/ICSICT55466.2022.9963256
RT T1 <cTitle>2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)</cTitle>: T1 <Title>A Rigorous Analysis of Specific ON-resistance for 4H-SiC Superjunction Devices</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9963256&Exemplar=1&LAN=DE A1 Xiong, Juncheng A1 Huang, Haimeng A1 Zhen, Wenxi A1 Zhang, Zimin A1 Cheng, Junji A1 Yi, Bo A1 Yang, Hongqiang A1 Zhang, Guoyi YR 2022 K1 Performance evaluation K1 Integrated circuit technology K1 Degradation K1 Electric breakdown K1 Ionization K1 Electron mobility K1 Conductivity SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/ICSICT55466.2022.9963256 DO https://doi.org/10.1109/ICSICT55466.2022.9963256 SF ELIB - SuUB Bremen
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