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1 Ergebnisse
1
Total-Ionizing-Dose Effects in Nanotube Tunnel Field-Effect..:
, In:
2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)
,
Wang, Xue-Ke
;
Sun, Ya-Bin
;
Liu, Yun
.. - p. 1-3 , 2022
Link:
https://doi.org/10.1109/ICSICT55466.2022.9963313
RT T1 <cTitle>2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)</cTitle>: T1 <Title>Total-Ionizing-Dose Effects in Nanotube Tunnel Field-Effect Transistor with Bias-Induced Electron-Hole Bilayer</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9963313&Exemplar=1&LAN=DE A1 Wang, Xue-Ke A1 Sun, Ya-Bin A1 Liu, Yun A1 Li, Xiao-Jin A1 Shi, Yan-Ling YR 2022 K1 Integrated circuit technology K1 Solid modeling K1 Radiation effects K1 Electron traps K1 Ionizing radiation K1 Tunneling K1 Transistors SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/ICSICT55466.2022.9963313 DO https://doi.org/10.1109/ICSICT55466.2022.9963313 SF ELIB - SuUB Bremen
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