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3D Electromigration Modelling for VLSI:

, In: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT),
Ming Tan, Cher ; Shabir, Abdul ; Banerjee, Debraj - p. 1-4 , 2022
Link: https://doi.org/10.1109/ICSICT55466.2022.9963434