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1 Ergebnisse
1
A comparative study on single event irradiation effects bet..:
, In:
2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)
,
Ren, Min
;
Wu, Yining
;
Yu, Shiheng
... - p. 1-3 , 2022
Link:
https://doi.org/10.1109/ICSICT55466.2022.9963465
RT T1 <cTitle>2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)</cTitle>: T1 <Title>A comparative study on single event irradiation effects between Trench MOSFET and Split-gate-trench MOSFET</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9963465&Exemplar=1&LAN=DE A1 Ren, Min A1 Wu, Yining A1 Yu, Shiheng A1 Lai, Xinzhang A1 Zhuo, Ningze A1 Li, Zehong A1 Zhang, Bo YR 2022 K1 Integrated circuit technology K1 MOSFET K1 Radiation effects K1 Split gate flash memory cells K1 Logic gates K1 Periodic structures SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/ICSICT55466.2022.9963465 DO https://doi.org/10.1109/ICSICT55466.2022.9963465 SF ELIB - SuUB Bremen
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