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1 Ergebnisse
1
On Reducing Power during Test Process of FPGAs:
, In:
2022 10th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO)
,
Ahmad, A.
- p. 1-5 , 2022
Link:
https://doi.org/10.1109/ICRITO56286.2022.9964598
RT T1 <cTitle>2022 10th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO)</cTitle>: T1 <Title>On Reducing Power during Test Process of FPGAs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9964598&Exemplar=1&LAN=DE A1 Ahmad, A. YR 2022 K1 Technological innovation K1 Power demand K1 Throughput K1 Software K1 Power dissipation K1 Internet of Things K1 Reliability K1 FPGA K1 power K1 test K1 BIST K1 DFT K1 LFSR K1 transition SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ICRITO56286.2022.9964598 DO https://doi.org/10.1109/ICRITO56286.2022.9964598 SF ELIB - SuUB Bremen
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