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1 Ergebnisse
1
AE5-SSIM: A Novel Unsupervised Tinfoils Defect Detection Mo..:
, In:
2022 16th IEEE International Conference on Signal Processing (ICSP)
,
Zhang, Fanghui
;
Zhang, Linna
;
Zhang, Damin
... - p. 212-217 , 2022
Link:
https://doi.org/10.1109/ICSP56322.2022.9965215
RT T1 <cTitle>2022 16th IEEE International Conference on Signal Processing (ICSP)</cTitle>: T1 <Title>AE5-SSIM: A Novel Unsupervised Tinfoils Defect Detection Model with Deep Autoencoder</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9965215&Exemplar=1&LAN=DE A1 Zhang, Fanghui A1 Zhang, Linna A1 Zhang, Damin A1 Huang, Yansen A1 Kan, Shichao A1 Cen, Yigang YR 2022 SN 2164-5221 K1 Training K1 Visualization K1 Limiting K1 Signal processing algorithms K1 Classification algorithms K1 Manufacturing K1 Detection algorithms K1 Anomaly detection K1 Deep autoencoder K1 Structural similarity K1 The tinfoils K1 Unsupervised learning SP 212 OP 217 LK http://dx.doi.org/https://doi.org/10.1109/ICSP56322.2022.9965215 DO https://doi.org/10.1109/ICSP56322.2022.9965215 SF ELIB - SuUB Bremen
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