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Robust and Accurate Measurement Methodology for High-speed ..:

, In: 2022 17th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT),
Chou, Fred ; Wei, Alex ; Hsieh, Johnny.. - p. 1-3 , 2022
Link: https://doi.org/10.1109/IMPACT56280.2022.9966699