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1 Ergebnisse
1
System Level IR Drop Impact on Chip Power Performance Signo..:
, In:
2022 17th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT)
,
Yong, Kin Fei
;
Lim, Chin Theng
;
Teng, Wei Khoon
- p. 1-4 , 2022
Link:
https://doi.org/10.1109/IMPACT56280.2022.9966707
RT T1
2022 17th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT)
: T1
System Level IR Drop Impact on Chip Power Performance Signoff for RISC-V System on Chip
UL https://suche.suub.uni-bremen.de/peid=ieee-9966707&Exemplar=1&LAN=DE A1 Yong, Kin Fei A1 Lim, Chin Theng A1 Teng, Wei Khoon YR 2022 SN 2150-5942 K1 Resistance K1 Power supplies K1 Switches K1 Voltage K1 Routing K1 Silicon K1 System-on-chip SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IMPACT56280.2022.9966707 DO https://doi.org/10.1109/IMPACT56280.2022.9966707 SF ELIB - SuUB Bremen
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