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1 Ergebnisse
1
Influence of Annealing Temperature on Emission and Capture ..:
, In:
2022 14th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM)
,
Benko, Peter
;
Kosa, Arpad
;
Matus, Matej
... - p. 1-4 , 2022
Link:
https://doi.org/10.1109/ASDAM55965.2022.9966749
RT T1
2022 14th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM)
: T1
Influence of Annealing Temperature on Emission and Capture Processes in GaAsN/GaAs Heterostructures
UL https://suche.suub.uni-bremen.de/peid=ieee-9966749&Exemplar=1&LAN=DE A1 Benko, Peter A1 Kosa, Arpad A1 Matus, Matej A1 Dawidowski, Wojciech A1 Radziewicz, Damian A1 Sciana, Beata A1 Stuchlikova, Lubica YR 2022 SN 2474-9737 K1 Temperature measurement K1 Micromechanical devices K1 Temperature distribution K1 Semiconductor device measurement K1 Schottky diodes K1 Spectroscopy K1 Annealing SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ASDAM55965.2022.9966749 DO https://doi.org/10.1109/ASDAM55965.2022.9966749 SF ELIB - SuUB Bremen
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