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1 Ergebnisse
1
Thermally stimulated depolarization current - characterizat..:
, In:
2022 14th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM)
,
Schaller, R.
;
Maier, F.
;
Mandl, R.
- p. 1-5 , 2022
Link:
https://doi.org/10.1109/ASDAM55965.2022.9966799
RT T1 <cTitle>2022 14th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM)</cTitle>: T1 <Title>Thermally stimulated depolarization current - characterization of a multi-layer dielectric stack for semiconductor packages</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9966799&Exemplar=1&LAN=DE A1 Schaller, R. A1 Maier, F. A1 Mandl, R. YR 2022 SN 2474-9737 K1 Temperature measurement K1 Micromechanical devices K1 Temperature distribution K1 Semiconductor device measurement K1 Semiconductor devices K1 Polyimides K1 Glass SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ASDAM55965.2022.9966799 DO https://doi.org/10.1109/ASDAM55965.2022.9966799 SF ELIB - SuUB Bremen
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