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1 Ergebnisse
1
BISON: BCI-based Interaction Concepts for Operating Microsc..:
, In:
2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)
,
Rekrut, Maurice
;
Nadig, Matthias
;
Jungbluth, Tobias
. - p. 393-398 , 2022
Link:
https://doi.org/10.1109/MetroXRAINE54828.2022.9967690
RT T1 <cTitle>2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)</cTitle>: T1 <Title>BISON: BCI-based Interaction Concepts for Operating Microscopes in Neurosurgery</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9967690&Exemplar=1&LAN=DE A1 Rekrut, Maurice A1 Nadig, Matthias A1 Jungbluth, Tobias A1 Ihl, Johannes YR 2022 K1 Training K1 Microscopy K1 Prototypes K1 Neural engineering K1 Metrology K1 Brain-computer interfaces K1 Neurosurgery K1 BCI K1 EEG K1 Microscope SP 393 OP 398 LK http://dx.doi.org/https://doi.org/10.1109/MetroXRAINE54828.2022.9967690 DO https://doi.org/10.1109/MetroXRAINE54828.2022.9967690 SF ELIB - SuUB Bremen
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