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1 Ergebnisse
1
A Method Monitoring Healthy State of Bond Wires in IGBT Bas..:
, In:
IECON 2022 – 48th Annual Conference of the IEEE Industrial Electronics Society
,
Liu, Shuaihu
;
Tu, Chunming
;
Long, Liu
... - p. 1-6 , 2022
Link:
https://doi.org/10.1109/IECON49645.2022.9968484
RT T1
IECON 2022 – 48th Annual Conference of the IEEE Industrial Electronics Society
: T1
A Method Monitoring Healthy State of Bond Wires in IGBT Based on dVCE/diC
UL https://suche.suub.uni-bremen.de/peid=ieee-9968484&Exemplar=1&LAN=DE A1 Liu, Shuaihu A1 Tu, Chunming A1 Long, Liu A1 Xu, Haoliang A1 Xiao, Biao A1 Zhu, Zixian YR 2022 SN 2577-1647 K1 Temperature measurement K1 Insulated gate bipolar transistors K1 Temperature sensors K1 Condition monitoring K1 Temperature distribution K1 Voltage measurement K1 Wires K1 dVCE/diC K1 IGBT Modules K1 bond wires K1 aging SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IECON49645.2022.9968484 DO https://doi.org/10.1109/IECON49645.2022.9968484 SF ELIB - SuUB Bremen
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