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Identification of Thin Layer Via Source Wave-Field Dictiona..:

, In: IECON 2022 – 48th Annual Conference of the IEEE Industrial Electronics Society,
Chakraborty, Supriyo ; Routray, Aurobinda ; Tewari, Ritesh Chandra - p. 1-6 , 2022
Link: https://doi.org/10.1109/IECON49645.2022.9968693