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Statistical Analysis of Varistor Capacitance under Slow-Fro..:
, In:
IECON 2022 – 48th Annual Conference of the IEEE Industrial Electronics Society
,
Muremi, Lutendo
;
Bokoro, Pitshou
;
Doorsamy, Wesley
- p. 1-5 , 2022
Link:
https://doi.org/10.1109/IECON49645.2022.9968764
RT T1
IECON 2022 – 48th Annual Conference of the IEEE Industrial Electronics Society
: T1
Statistical Analysis of Varistor Capacitance under Slow-Front Overvoltages
UL https://suche.suub.uni-bremen.de/peid=ieee-9968764&Exemplar=1&LAN=DE A1 Muremi, Lutendo A1 Bokoro, Pitshou A1 Doorsamy, Wesley YR 2022 SN 2577-1647 K1 Varistors K1 Degradation K1 Arresters K1 Low voltage K1 Switches K1 Capacitance K1 Zinc oxide K1 Zinc oxide varistor K1 degradation K1 switching surges K1 varistor capacitance K1 analysis of variance SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IECON49645.2022.9968764 DO https://doi.org/10.1109/IECON49645.2022.9968764 SF ELIB - SuUB Bremen
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