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1 Ergebnisse
1
Robust Real-time Junction Detection Under Various Condition..:
, In:
IECON 2022 – 48th Annual Conference of the IEEE Industrial Electronics Society
,
Jeon, Hyung-Joon
;
Jeon, Jae Wook
- p. 1-6 , 2022
Link:
https://doi.org/10.1109/IECON49645.2022.9969099
RT T1
IECON 2022 – 48th Annual Conference of the IEEE Industrial Electronics Society
: T1
Robust Real-time Junction Detection Under Various Conditions Using Dark Channel Maps
UL https://suche.suub.uni-bremen.de/peid=ieee-9969099&Exemplar=1&LAN=DE A1 Jeon, Hyung-Joon A1 Jeon, Jae Wook YR 2022 SN 2577-1647 K1 Deep learning K1 Industrial electronics K1 Roads K1 Neural networks K1 Feature extraction K1 Real-time systems K1 Junctions K1 junction detection K1 dark channels K1 deep neural networks K1 ResNet K1 EfficientNet SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IECON49645.2022.9969099 DO https://doi.org/10.1109/IECON49645.2022.9969099 SF ELIB - SuUB Bremen
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