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1 Ergebnisse
1
Voltage Bias Enhancement for Leakage Test on Discrete Produ..:
, In:
2022 IEEE 39th International Electronics Manufacturing Technology Conference (IEMT)
,
Nizam Bin Nik Zainuddin, Nik Ahmad
;
Binti Mohamad Yasin, Nur Yashidar
;
Binti Ardnan, Nur Syazreen
... - p. 1-5 , 2022
Link:
https://doi.org/10.1109/IEMT55343.2022.9969485
RT T1
2022 IEEE 39th International Electronics Manufacturing Technology Conference (IEMT)
: T1
Voltage Bias Enhancement for Leakage Test on Discrete Products to Detect Low Contact
UL https://suche.suub.uni-bremen.de/peid=ieee-9969485&Exemplar=1&LAN=DE A1 Nizam Bin Nik Zainuddin, Nik Ahmad A1 Binti Mohamad Yasin, Nur Yashidar A1 Binti Ardnan, Nur Syazreen A1 Gan, Chee Keat A1 Naim Bin Muhammad Zin, Mohd Fakrul A1 Jalar, Azman YR 2022 K1 Semiconductor device measurement K1 Breakdown voltage K1 Voltage measurement K1 Wires K1 Sociology K1 Semiconductor diodes K1 Transistors K1 semiconductor K1 discrete device K1 low contact defect K1 disturbed wire K1 leakage test SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IEMT55343.2022.9969485 DO https://doi.org/10.1109/IEMT55343.2022.9969485 SF ELIB - SuUB Bremen
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