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1 Ergebnisse
1
Characterisation and Modelling of 22-nm FD-SOI Transistors ..:
, In:
2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS)
,
Andrade-Miceli, Dennis
;
Power, Conor
;
Esmailiyan, Ali
... - p. 1-4 , 2022
Link:
https://doi.org/10.1109/ICECS202256217.2022.9970969
RT T1 <cTitle>2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS)</cTitle>: T1 <Title>Characterisation and Modelling of 22-nm FD-SOI Transistors Operating at Cryogenic Temperatures</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9970969&Exemplar=1&LAN=DE A1 Andrade-Miceli, Dennis A1 Power, Conor A1 Esmailiyan, Ali A1 Siriburanon, Teerachot A1 Bashir, Imran A1 Asker, Mike A1 Leipold, Dirk A1 Staszewski, R. Bogdan A1 Blokhina, Elena YR 2022 K1 Semiconductor device modeling K1 Semiconductor device measurement K1 Temperature distribution K1 Computational modeling K1 Simulation K1 Qubit K1 Silicon-on-insulator K1 Cryogenic CMOS K1 FD-SOI MOSFETs K1 quantum computing K1 semiconductor modelling SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICECS202256217.2022.9970969 DO https://doi.org/10.1109/ICECS202256217.2022.9970969 SF ELIB - SuUB Bremen
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