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Investigation of p-GaN Gate HEMT using Removal Si Substrate..:

, In: 2022 IET International Conference on Engineering Technologies and Applications (IET-ICETA),
Lin, Y. ; Chiu, Y. S. ; Chang, E. Y. - p. 1-2 , 2022
Link: https://doi.org/10.1109/IET-ICETA56553.2022.9971618