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1 Ergebnisse
1
Test Vector Generation and Sensitivity Analysis for Hardwar..:
, In:
2022 International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics ( DISCOVER)
,
Kavya Patel, G.S
;
Ramesh, S.R
;
Nirmala, Devi M.
- p. 84-89 , 2022
Link:
https://doi.org/10.1109/DISCOVER55800.2022.9974745
RT T1
2022 International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics ( DISCOVER)
: T1
Test Vector Generation and Sensitivity Analysis for Hardware Trojan Detection in Compact Rare Nodes
UL https://suche.suub.uni-bremen.de/peid=ieee-9974745&Exemplar=1&LAN=DE A1 Kavya Patel, G.S A1 Ramesh, S.R A1 Nirmala, Devi M. YR 2022 K1 Industries K1 Fabrication K1 Sensitivity analysis K1 Electric variables measurement K1 Very large scale integration K1 Robot sensing systems K1 Hardware K1 Rare nodes K1 Transition probability K1 SCOAP measure K1 Hamming distance SP 84 OP 89 LK http://dx.doi.org/https://doi.org/10.1109/DISCOVER55800.2022.9974745 DO https://doi.org/10.1109/DISCOVER55800.2022.9974745 SF ELIB - SuUB Bremen
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