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1 Ergebnisse
1
Characterization of Gallium-Doped ZnO Thin Films Deposited ..:
, In:
2022 19th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)
,
Balcazar, L.M.
;
Rodriguez, J.J.
;
Ashok, A.
.. - p. 1-6 , 2022
Link:
https://doi.org/10.1109/CCE56709.2022.9975903
RT T1 <cTitle>2022 19th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)</cTitle>: T1 <Title>Characterization of Gallium-Doped ZnO Thin Films Deposited by the Ultrasonic Spray Pyrolysis Technique</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9975903&Exemplar=1&LAN=DE A1 Balcazar, L.M. A1 Rodriguez, J.J. A1 Ashok, A. A1 Maldonado, A. A1 Olvera, M.L. YR 2022 SN 2642-3766 K1 Gallium K1 II-VI semiconductor materials K1 Photonic band gap K1 Conductivity K1 Zinc oxide K1 Optical imaging K1 Acoustics K1 Ga-doped zinc oxide K1 Ultrasonic spray pyrolysis technique K1 Basic characterization techniques SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/CCE56709.2022.9975903 DO https://doi.org/10.1109/CCE56709.2022.9975903 SF ELIB - SuUB Bremen
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