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1 Ergebnisse
1
Using Fault Detection Tests to Produce Diagnostic Tests Tar..:
, In:
2022 IEEE 31st Asian Test Symposium (ATS)
,
Addepalli, Hari
;
Pomeranz, Irith
;
Amyeen, Enamul
... - p. 120-125 , 2022
Link:
https://doi.org/10.1109/ATS56056.2022.00033
RT T1
2022 IEEE 31st Asian Test Symposium (ATS)
: T1
Using Fault Detection Tests to Produce Diagnostic Tests Targeting Large Sets of Candidate Faults
UL https://suche.suub.uni-bremen.de/peid=ieee-9978945&Exemplar=1&LAN=DE A1 Addepalli, Hari A1 Pomeranz, Irith A1 Amyeen, Enamul A1 Natarajan, Suriyaprakash A1 Sinha, Arani A1 Venkataraman, Srikanth YR 2022 SN 2377-5386 K1 Fault diagnosis K1 Fault detection K1 Microprocessors K1 Benchmark testing K1 Electrical fault detection K1 Test pattern generators K1 Integrated circuit modeling K1 Candidate faults K1 diagnostic test generation K1 failure analysis K1 logic diagnosis K1 stuck-at faults SP 120 OP 125 LK http://dx.doi.org/https://doi.org/10.1109/ATS56056.2022.00033 DO https://doi.org/10.1109/ATS56056.2022.00033 SF ELIB - SuUB Bremen
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