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1 Ergebnisse
1
High Precision Voltage Measurement System Utilizing Low-End..:
, In:
2022 IEEE 31st Asian Test Symposium (ATS)
,
Sato, Keno
;
Nakatani, Takayuki
;
Katayama, Shogo
... - p. 37-42 , 2022
Link:
https://doi.org/10.1109/ATS56056.2022.00019
RT T1
2022 IEEE 31st Asian Test Symposium (ATS)
: T1
High Precision Voltage Measurement System Utilizing Low-End ATE Resource and BOST
UL https://suche.suub.uni-bremen.de/peid=ieee-9979033&Exemplar=1&LAN=DE A1 Sato, Keno A1 Nakatani, Takayuki A1 Katayama, Shogo A1 Iimori, Daisuke A1 Ogihara, Gaku A1 Ishida, Takashi A1 Okamoto, Toshiyuki A1 Ichikawa, Tamotsu A1 Zhao, Yujie A1 Katoh, Kentaroh A1 Kuwana, Anna A1 Hatayama, Kazumi A1 Kobayashi, Haruo YR 2022 SN 2377-5386 K1 Temperature measurement K1 Performance evaluation K1 Temperature sensors K1 Semiconductor device measurement K1 Voltage measurement K1 Costs K1 Prototypes K1 ADC K1 High Resolution K1 Subranging K1 Voltage Measurement K1 Mixed-Signal IC Testing K1 ATE K1 BOST SP 37 OP 42 LK http://dx.doi.org/https://doi.org/10.1109/ATS56056.2022.00019 DO https://doi.org/10.1109/ATS56056.2022.00019 SF ELIB - SuUB Bremen
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