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Study on GaN FET Short Circuit Characteristics and Developm..:

, In: 2022 25th International Conference on Electrical Machines and Systems (ICEMS),
Kim, Chul-Min ; Kim, Jong-Soo ; Kim, Nam-Joon - p. 1-5 , 2022
Link: https://doi.org/10.1109/ICEMS56177.2022.9982880