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1 Ergebnisse
1
Accelerating RRAM Testing with a Low-cost Computation-in-Me..:
, In:
2022 IEEE International Test Conference (ITC)
,
Singh, Abhairaj
;
Fieback, Moritz
;
Bishnoi, Rajendra
... - p. 400-409 , 2022
Link:
https://doi.org/10.1109/ITC50671.2022.00085
RT T1
2022 IEEE International Test Conference (ITC)
: T1
Accelerating RRAM Testing with a Low-cost Computation-in-Memory based DFT
UL https://suche.suub.uni-bremen.de/peid=ieee-9983865&Exemplar=1&LAN=DE A1 Singh, Abhairaj A1 Fieback, Moritz A1 Bishnoi, Rajendra A1 Bradaric, Filip A1 Gebregiorgis, Anteneh A1 Joshi, Rajiv V. A1 Hamdioui, Said YR 2022 SN 2378-2250 K1 Discrete Fourier transforms K1 Resistive RAM K1 Life estimation K1 Voltage K1 Reconfigurable logic K1 Feature extraction K1 Design for testability K1 Design-for-testability (DFT) K1 Testing RRAM K1 computation-in-memory (CIM) K1 binary logic K1 RRAM defects SP 400 OP 409 LK http://dx.doi.org/https://doi.org/10.1109/ITC50671.2022.00085 DO https://doi.org/10.1109/ITC50671.2022.00085 SF ELIB - SuUB Bremen
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